InfraTec’s Cameras are used with increasing Success in numerous Applicaton Areas
Thermal optimisation in micrometer range
Due to increasing performance requirements for electronic components, enourmous demands for thermal management at ever smaller scales are placed. The Frauenhofer Institute for Silicon Technology (ISIT), as development partner, supports companies in meeting these growing needs in an optimal fashion.
The ISIT has to detect the smallest possible temperature differences when analysing electronic components. With InfraTec’s high-end camera series ImageIR® temperature differences of 15 mK can precisely be measured and securely identify even newly emerging thermal issues. Thus, development failures can be avoided at an early stage. The cameras are available with different detector formats of up to (1,024 × 1,280) IR pixels. Using a 15 µm pitch together with different, high performance microscope lenses, a geometric resolution of only 2 µm can be achieved.
Another benefit for the ISIT derives from the precision calibration of the ImageIR®. The use of a set of additional side calibration curves compensates for drift and ensures a maximum measurement accuracy even under fluctuating measurement conditions. As with all thermographic testings of electronic components and circuits, measurements are influenced by the differing emissivity of the individual components. To overcome this situation, InfraTec offers an automated pixel-wise emissivity correction routine directly in its control and analysis software IRBIS® 3. Using these tools precise statements can be made about temperature distributions and developments over time.